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Scanning probe microscope (table top)

Scanning probe microscope (table top)

Scanning probe microscope (table top)
Manufacturer
Veeco Digital Instruments
Model
CP-II
Category
Microscopy
Application

Imaging of surfaces using different SPM techniques

Description
  • Scanning area 100x100x7.5 µm
  • Sample size: up to 10×10 mm
  • Scanning by sample
  • Manual XY stage 8×8 mm
  • Motorized Z stage
  • Optical microscope (20x) for tip and sample view

 

SPM Techniques:

  • contact mode, tapping mode, force modulation mode
  • scanning tunneling microscopy (STM)
  • magnetic force microscopy (MFM)
  • nanolithography by mechanical scratch






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