
Manufacturer
Veeco Digital Instruments
Model
CP-II
Category
Microscopy
Application
Imaging of surfaces using different SPM techniques
Description
- Scanning area 100x100x7.5 µm
- Sample size: up to 10×10 mm
- Scanning by sample
- Manual XY stage 8×8 mm
- Motorized Z stage
- Optical microscope (20x) for tip and sample view
SPM Techniques:
- contact mode, tapping mode, force modulation mode
- scanning tunneling microscopy (STM)
- magnetic force microscopy (MFM)
- nanolithography by mechanical scratch