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Scanning Kelvin probe system - Materize
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Scanning Kelvin probe system

Scanning Kelvin probe system

Scanning Kelvin probe system
Manufacturer
KP Technology
Model
SKP5050
Category
Materials characterization
Application

Measurement of surface potential of organic compounds, determination of work function of metals and Fermi level of inorganic semiconductors

Description
  • Measurement capability: two-dimensional surface potential measurements
  • Surface potential measurement range: –9,6 to 9,6 V
  • Work function resolution: 1-3meV
  • Tip size: 2mm diameter
  • Max. scan area: 50mm x 50 mm
  • Position resolution: 318 nm
  • Sample stage control: manual and auto
  • Maximum thickness of sample: 20mm
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