Manufacturer
Ecopia
Model
HMS-5000
Category
Materials characterization
Application
Characterization of various materials including all semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured), metal layers, oxides, etc. Testing of Temperature vs carrier density, mobility,resistivity, hall coefficient, conductivity, etc.
Description
- Sample size: 5 mm x 5mm up to 15mm x 15mm
- Resistivity: 10-4 to 107 (Ohms-cm)
- Magnet: permanent magnet, 30 mm diameter
- Magnet Flux Density: 0.55 T nominal ±1% of marked value
- Mobility: (cm2/Volt-sec) 1 ~ 107
- Concentration: (cm-3): 107~ 1021
- Current Source: range: 1 nA – 20 mA compliance: 12 V
- Minimum Hall voltage: 1 μV
- Temperature ranges: 5000: 80K to 350K (only)
