Transmission electron microscope

Applied physics, materials science

• TEM point resolution 0.25 nm, line resolution 0.102 nm
• Information limit 0.14 nm
• Schottky field emitter with high maximum beam current (> 100 nA)
• Energy spread 0.7 eV
• Flexible high tension (20, 40, 80, 120,160, 200 kV and values in between)
• Fully computer-controlled, eucentric side-entry
• High stability CompuStage X, Y movement ± 1 mm, Z movement ± 0.375 mm
• Specimen size 3 mm